Department of Electronics and Electrical Communication Engineering
Indian Institute of Technology Kharagpur, India
In the first row images, the left image is an LR image, and the model’s
uncertainty during upscaling is in the right. Two cropped regions have
different textures. We can observe from two patches in the second and
third-row that whenever the model fails to reconstruct the texture
correctly (second-row image), it leads to higher uncertainty.
Abstract
Convolutional neural network (CNN) has achieved unprecedented
success in image super-resolution tasks in recent years. However,
the network's performance depends on the distribution of the
training sets and degrades on out-of-distribution samples. This
paper adopts a Bayesian approach for estimating uncertainty
associated with output and applies it in a deep image
super-resolution model to address the concern mentioned above. We
use the uncertainty estimation technique using the
batch-normalization layer, where stochasticity of the batch mean and
variance generate Monte-Carlo (MC) samples. The MC samples, which
are nothing but different super-resolved images using different
stochastic parameters, reconstruct the image, and provide a
confidence or uncertainty map of the reconstruction. We propose a
faster approach for MC sample generation, and it allows the variable
image size during testing. Therefore, it will be useful for image
reconstruction domain. Our experimental findings show that this
uncertainty map strongly relates to the quality of reconstruction
generated by the deep CNN model and explains its limitation.
Furthermore, this paper proposes an approach to reduce the model's
uncertainty for an input image, and it helps to defend the
adversarial attacks on the image super-resolution model. The
proposed uncertainty reduction technique also improves the
performance of the model for out-of-distribution test images. To the
best of our knowledge, we are the first to propose an adversarial
defense mechanism in any image reconstruction domain.
Highlights
We propose a faster implementation of Monte Carlo
batch-normalization uncertainty to generate MC samples and
overcome the hurdle of variable image size.
We address the uncertainty of deep SISR models using Bayesian
approach to measure it. To the best of our knowledge, we are the
first to estimate uncertainty in deep learning models for image
reconstruction. We also discuss the advantages and implications of
uncertainty in SISR and its usefulness in understanding the
model's limitations and outcome.
We also propose an approach to reduce the model uncertainty for a
test image. The uncertainty reduction method acts as a defense
against the adversarial attack on the SISR model and proves to be
beneficial for out-of-distribution noisy low-resolution images.
Modified Method for Uncertainty
Estimation
Proposed Method for Uncertainty
Reduction
Understanding Uncertainty
(a)-(b) present effect of PSNR and uncertainty with the increase of MC
samples and (c)-(d) present impact of PSNR and adv. noise with
uncertainty. (e)-(f) present the influence of Bayesian uncertainty with
different Scale factor models and random noise on LR images. (click on
the image for the best view)
Performance Analysis of
Adversarial Defense
Visual Results of Adversarial Defense
Performance of our proposed adversarial defense mechanism using the
Bayesian uncertainty reduction technique. The cropped region shows
undesired artifacts in the SR image without any defense, and our defense
mechanism successfully suppresses those artifacts.
Downloads
References
Kim, J., Lee, J.K. and Lee, K.M., 2016. Accurate image
super-resolution using very deep convolutional networks. In
Proceedings of the IEEE conference on computer vision and pattern
recognition (pp. 1646-1654).
Choi, J.H., Zhang, H., Kim, J.H., Hsieh, C.J. and Lee, J.S., 2019.
Evaluating robustness of deep image super-resolution against
adversarial attacks. In Proceedings of the IEEE/CVF International
Conference on Computer Vision (pp. 303-311).
Gal, Y. and Ghahramani, Z., 2016, June. Dropout as a bayesian
approximation: Representing model uncertainty in deep learning. In
international conference on machine learning (pp. 1050-1059).
PMLR.
Teye, M., Azizpour, H. and Smith, K., 2018, July. Bayesian
uncertainty estimation for batch normalized deep networks. In
International Conference on Machine Learning (pp. 4907-4916).
PMLR.
Kendall, A., Badrinarayanan, V. and Cipolla, R., 2017, July.
Bayesian segnet: Model uncertainty in deep convolutional
encoder-decoder architectures for scene understanding. In British
Machine Vision Conference 2017, BMVC 2017.
Citation (BibTeX)
@InProceedings{Kar_2021_CVPR,
author = {Kar, Aupendu and Biswas, Prabir Kumar},
title = {Fast Bayesian Uncertainty Estimation and reduction of
Batch Normalized Single Image Super-Resolution Network},
booktitle = {Proceedings of the IEEE/CVF Conference on Computer
Vision and Pattern Recognition (CVPR)},
month = {June},
year = {2021},
pages = {4957-4966}
}